CWE-1248: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
A semiconductor device can fail for various reasons. While some are manufacturing and packaging defects, the rest are due to prolonged use or usage under extreme conditions. Some mechanisms that lead to semiconductor defects include encapsulation failure, die-attach failure, wire-bond failure, bulk-silicon defects, oxide-layer faults, aluminum-metal faults (including electromigration, corrosion of aluminum, etc.), and thermal/electrical stress. These defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, security guarantees offered by the device will be compromised.
The table(s) below shows the weaknesses and high level categories that are related to this weakness. These relationships are defined as ChildOf, ParentOf, MemberOf and give insight to similar items that may exist at higher and lower levels of abstraction. In addition, relationships such as PeerOf and CanAlsoBe are defined to show similar weaknesses that the user may want to explore.
Relevant to the view "Research Concepts" (CWE-1000)
Relevant to the view "Hardware Design" (CWE-1194)
The different Modes of Introduction provide information about how and when this weakness may be introduced. The Phase identifies a point in the life cycle at which introduction may occur, while the Note provides a typical scenario related to introduction during the given phase.
The listings below show possible areas for which the given weakness could appear. These may be for specific named Languages, Operating Systems, Architectures, Paradigms, Technologies, or a class of such platforms. The platform is listed along with how frequently the given weakness appears for that instance.
Class: Language-Independent (Undetermined Prevalence)
Class: OS-Independent (Undetermined Prevalence)
Class: Architecture-Independent (Undetermined Prevalence)
Class: Technology-Independent (Undetermined Prevalence)
The table below specifies different individual consequences associated with the weakness. The Scope identifies the application security area that is violated, while the Impact describes the negative technical impact that arises if an adversary succeeds in exploiting this weakness. The Likelihood provides information about how likely the specific consequence is expected to be seen relative to the other consequences in the list. For example, there may be high likelihood that a weakness will be exploited to achieve a certain impact, but a low likelihood that it will be exploited to achieve a different impact.
The network-on-chip implements a firewall for access control to peripherals from all IP cores capable of mastering transactions.
Example Language: Other
A manufacturing defect in this logic manifests itself as a logical fault, which always sets the output of the filter to "allow" access.
Post-manufacture testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.
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