CWE - CWE-1248: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications (4.16)

Weakness ID: 1248

Vulnerability Mapping: ALLOWED This CWE ID may be used to map to real-world vulnerabilities
Abstraction: Base Base - a weakness that is still mostly independent of a resource or technology, but with sufficient details to provide specific methods for detection and prevention. Base level weaknesses typically describe issues in terms of 2 or 3 of the following dimensions: behavior, property, technology, language, and resource.

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Description

The security-sensitive hardware module contains semiconductor defects.

Extended Description

A semiconductor device can fail for various reasons. While some are manufacturing and packaging defects, the rest are due to prolonged use or usage under extreme conditions. Some mechanisms that lead to semiconductor defects include encapsulation failure, die-attach failure, wire-bond failure, bulk-silicon defects, oxide-layer faults, aluminum-metal faults (including electromigration, corrosion of aluminum, etc.), and thermal/electrical stress. These defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.

Common Consequences

This table specifies different individual consequences associated with the weakness. The Scope identifies the application security area that is violated, while the Impact describes the negative technical impact that arises if an adversary succeeds in exploiting this weakness. The Likelihood provides information about how likely the specific consequence is expected to be seen relative to the other consequences in the list. For example, there may be high likelihood that a weakness will be exploited to achieve a certain impact, but a low likelihood that it will be exploited to achieve a different impact.

Scope	Impact	Likelihood
Availability Access Control	Technical Impact: DoS: Instability

Potential Mitigations

Phase: Testing

While semiconductor-manufacturing companies implement several mechanisms to continuously improve the semiconductor manufacturing process to ensure reduction of defects, some defects can only be fixed after manufacturing. Post-manufacturing testing of silicon die is critical. Fault models such as stuck-at-0 or stuck-at-1 must be used to develop post-manufacturing test cases and achieve good coverage. Once the silicon packaging is done, extensive post-silicon testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.

Phase: Operation

Operating the hardware outside device specification, such as at extremely high temperatures, voltage, etc., accelerates semiconductor degradation and results in defects. When these defects manifest as faults in security-critical, hardware modules, it results in compromise of security guarantees. Thus, operating the device within the specification is important.

Relationships

This table shows the weaknesses and high level categories that are related to this weakness. These relationships are defined as ChildOf, ParentOf, MemberOf and give insight to similar items that may exist at higher and lower levels of abstraction. In addition, relationships such as PeerOf and CanAlsoBe are defined to show similar weaknesses that the user may want to explore.

Relevant to the view "Research Concepts" (CWE-1000)

Nature	Type	ID	Name
ChildOf	Pillar - a weakness that is the most abstract type of weakness and represents a theme for all class/base/variant weaknesses related to it. A Pillar is different from a Category as a Pillar is still technically a type of weakness that describes a mistake, while a Category represents a common characteristic used to group related things.	693	Protection Mechanism Failure

Relevant to the view "Hardware Design" (CWE-1194)

Nature	Type	ID	Name
MemberOf	Category - a CWE entry that contains a set of other entries that share a common characteristic.	1195	Manufacturing and Life Cycle Management Concerns
MemberOf	Category - a CWE entry that contains a set of other entries that share a common characteristic.	1206	Power, Clock, Thermal, and Reset Concerns
MemberOf	Category - a CWE entry that contains a set of other entries that share a common characteristic.	1388	Physical Access Issues and Concerns

Modes Of Introduction

The different Modes of Introduction provide information about how and when this weakness may be introduced. The Phase identifies a point in the life cycle at which introduction may occur, while the Note provides a typical scenario related to introduction during the given phase.

Phase	Note
Manufacturing	May be introduced due to issues in the manufacturing environment or improper handling of components, for example.
Operation	May be introduced by improper handling or usage outside of rated operating environments (temperature, humidity, etc.)

Applicable Platforms

This listing shows possible areas for which the given weakness could appear. These may be for specific named Languages, Operating Systems, Architectures, Paradigms, Technologies, or a class of such platforms. The platform is listed along with how frequently the given weakness appears for that instance.

Languages

Class: Not Language-Specific (Undetermined Prevalence)

Operating Systems

Class: Not OS-Specific (Undetermined Prevalence)

Architectures

Class: Not Architecture-Specific (Undetermined Prevalence)

Technologies

Class: Not Technology-Specific (Undetermined Prevalence)

Demonstrative Examples

Example 1

The network-on-chip implements a firewall for access control to peripherals from all IP cores capable of mastering transactions.

(bad code)

Example Language: Other

A manufacturing defect in this logic manifests itself as a logical fault, which always sets the output of the filter to "allow" access.

Post-manufacture testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.

Memberships

This MemberOf Relationships table shows additional CWE Categories and Views that reference this weakness as a member. This information is often useful in understanding where a weakness fits within the context of external information sources.

Nature	Type	ID	Name
MemberOf	Category - a CWE entry that contains a set of other entries that share a common characteristic.	1413	Comprehensive Categorization: Protection Mechanism Failure

Vulnerability Mapping Notes

Usage: ALLOWED

(this CWE ID may be used to map to real-world vulnerabilities)

Reason: Acceptable-Use

Rationale:

This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.

Comments:

Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.

Related Attack Patterns

CAPEC-ID	Attack Pattern Name
CAPEC-624	Hardware Fault Injection
CAPEC-625	Mobile Device Fault Injection

References

[REF-1067] Brian Bailey. "Why Chips Die". <https://semiengineering.com/why-chips-die/>.

[REF-1068] V. Lakshminarayan. "What causes semiconductor devices to fail". <Original>. URL validated: 2023-04-07.

Content History

Submissions
Submission Date	Submitter	Organization
2020-02-12 (CWE 4.0, 2020-02-24)	Arun Kanuparthi, Hareesh Khattri, Parbati Kumar Manna, Narasimha Kumar V Mangipudi	Intel Corporation
2020-02-12 (CWE 4.0, 2020-02-24)
Modifications
Modification Date	Modifier	Organization
2020-08-20	CWE Content Team	MITRE
2020-08-20	updated Modes_of_Introduction, Related_Attack_Patterns
2022-06-28	CWE Content Team	MITRE
2022-06-28	updated Relationships
2023-01-31	CWE Content Team	MITRE
2023-01-31	updated Related_Attack_Patterns, Relationships
2023-04-27	CWE Content Team	MITRE
2023-04-27	updated Description, References, Relationships
2023-06-29	CWE Content Team	MITRE
2023-06-29	updated Mapping_Notes


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Common Weakness Enumeration

CWE-1248: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications

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