CWE-1248: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
Weakness ID: 1248
Vulnerability Mapping:
ALLOWEDThis CWE ID may be used to map to real-world vulnerabilities Abstraction: BaseBase - a weakness that is still mostly independent of a resource or technology, but with sufficient details to provide specific methods for detection and prevention. Base level weaknesses typically describe issues in terms of 2 or 3 of the following dimensions: behavior, property, technology, language, and resource.
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Description
The security-sensitive hardware module contains semiconductor defects.
Extended Description
A semiconductor device can fail for various reasons. While some are manufacturing and packaging defects, the rest are due to prolonged use or usage under extreme conditions. Some mechanisms that lead to semiconductor defects include encapsulation failure, die-attach failure, wire-bond failure, bulk-silicon defects, oxide-layer faults, aluminum-metal faults (including electromigration, corrosion of aluminum, etc.), and thermal/electrical stress. These defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.
Common Consequences
This table specifies different individual consequences associated with the weakness. The Scope identifies the application security area that is violated, while the Impact describes the negative technical impact that arises if an adversary succeeds in exploiting this weakness. The Likelihood provides information about how likely the specific consequence is expected to be seen relative to the other consequences in the list. For example, there may be high likelihood that a weakness will be exploited to achieve a certain impact, but a low likelihood that it will be exploited to achieve a different impact.
Scope
Impact
Likelihood
Availability Access Control
Technical Impact: DoS: Instability
Potential Mitigations
Phase: Testing
While semiconductor-manufacturing companies implement several mechanisms to continuously improve the semiconductor manufacturing process to ensure reduction of defects, some defects can only be fixed after manufacturing. Post-manufacturing testing of silicon die is critical. Fault models such as stuck-at-0 or stuck-at-1 must be used to develop post-manufacturing test cases and achieve good coverage. Once the silicon packaging is done, extensive post-silicon testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.
Phase: Operation
Operating the hardware outside device specification, such as at extremely high temperatures, voltage, etc., accelerates semiconductor degradation and results in defects. When these defects manifest as faults in security-critical, hardware modules, it results in compromise of security guarantees. Thus, operating the device within the specification is important.
Relationships
This table shows the weaknesses and high level categories that are related to this weakness. These relationships are defined as ChildOf, ParentOf, MemberOf and give insight to similar items that may exist at higher and lower levels of abstraction. In addition, relationships such as PeerOf and CanAlsoBe are defined to show similar weaknesses that the user may want to explore.
Relevant to the view "Research Concepts" (CWE-1000)
Nature
Type
ID
Name
ChildOf
Pillar - a weakness that is the most abstract type of weakness and represents a theme for all class/base/variant weaknesses related to it. A Pillar is different from a Category as a Pillar is still technically a type of weakness that describes a mistake, while a Category represents a common characteristic used to group related things.
This table shows the weaknesses and high level categories that are related to this weakness. These relationships are defined as ChildOf, ParentOf, MemberOf and give insight to similar items that may exist at higher and lower levels of abstraction. In addition, relationships such as PeerOf and CanAlsoBe are defined to show similar weaknesses that the user may want to explore.
Relevant to the view "Hardware Design" (CWE-1194)
Nature
Type
ID
Name
MemberOf
Category - a CWE entry that contains a set of other entries that share a common characteristic.
The different Modes of Introduction provide information about how and when this weakness may be introduced. The Phase identifies a point in the life cycle at which introduction may occur, while the Note provides a typical scenario related to introduction during the given phase.
Phase
Note
Manufacturing
May be introduced due to issues in the manufacturing environment or improper handling of components, for example.
Operation
May be introduced by improper handling or usage outside of rated operating environments (temperature, humidity, etc.)
Applicable Platforms
This listing shows possible areas for which the given weakness could appear. These may be for specific named Languages, Operating Systems, Architectures, Paradigms, Technologies, or a class of such platforms. The platform is listed along with how frequently the given weakness appears for that instance.
Languages
Class: Not Language-Specific (Undetermined Prevalence)
Operating Systems
Class: Not OS-Specific (Undetermined Prevalence)
Architectures
Class: Not Architecture-Specific (Undetermined Prevalence)
Technologies
Class: Not Technology-Specific (Undetermined Prevalence)
Demonstrative Examples
Example 1
The network-on-chip implements a firewall for access control to peripherals from all IP cores capable of mastering transactions.
(bad code)
Example Language: Other
A manufacturing defect in this logic manifests itself as a logical fault, which always sets the output of the filter to "allow" access.
Post-manufacture testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.
Memberships
This MemberOf Relationships table shows additional CWE Categories and Views that reference this weakness as a member. This information is often useful in understanding where a weakness fits within the context of external information sources.
Nature
Type
ID
Name
MemberOf
Category - a CWE entry that contains a set of other entries that share a common characteristic.
(this CWE ID could be used to map to real-world vulnerabilities)
Reason: Acceptable-Use
Rationale:
This CWE entry is at the Base level of abstraction, which is a preferred level of abstraction for mapping to the root causes of vulnerabilities.
Comments:
Carefully read both the name and description to ensure that this mapping is an appropriate fit. Do not try to 'force' a mapping to a lower-level Base/Variant simply to comply with this preferred level of abstraction.