Common Weakness Enumeration

Non-volatile memories such as NAND Flash, EEPROM, etc. have individually erasable segments, each of which can be put through a limited number of program/erase or write cycles. For example, the device can only endure a limited number of writes, after which the device becomes unreliable. In order to wear out the cells in a uniform manner, non-volatile memory and storage products based on the above-mentioned technologies implement a technique called wear leveling. Once a set threshold is reached, wear leveling maps writes of a logical block to a different physical block. This prevents a single physical block from prematurely failing due to a high concentration of writes. If wear leveling is improperly implemented, attackers may be able to programmatically cause the storage to become unreliable within a much shorter time than would normally be expected.

The table(s) below shows the weaknesses and high level categories that are related to this weakness. These relationships are defined as ChildOf, ParentOf, MemberOf and give insight to similar items that may exist at higher and lower levels of abstraction. In addition, relationships such as PeerOf and CanAlsoBe are defined to show similar weaknesses that the user may want to explore.

Relevant to the view "Research Concepts" (CWE-1000)

Nature	Type	ID	Name
ChildOf	Pillar - a weakness that is the most abstract type of weakness and represents a theme for all class/base/variant weaknesses related to it. A Pillar is different from a Category as a Pillar is still technically a type of weakness that describes a mistake, while a Category represents a common characteristic used to group related things.	664	Improper Control of a Resource Through its Lifetime

Relevant to the view "Hardware Design" (CWE-1194)

Nature	Type	ID	Name
MemberOf	Category - a CWE entry that contains a set of other entries that share a common characteristic.	1202	Memory and Storage Issues

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Example 1

An attacker can render a memory line unusable by repeatedly causing a write to the memory line.

Below is example code from [REF-1058] that the user can execute repeatedly to cause line failure. W is the maximum associativity of any cache in the system; S is the size of the largest cache in the system.

Without wear leveling, the above attack will be successful. Simple randomization of blocks will not suffice as instead of the original physical block, the randomized physical block will be worn out.

Research Gap